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Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s
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© 2008 Fairchild Semiconductor Corporation www.fairchildsemi.com
AN-6076
Design and Application Guide of Bootstrap Circuit for
High-Voltage Gate-Drive IC
Rev. 1.412/18/14
www.fairchildsemi.com
1. Introduction
The purpose of this paper is to demonstrate a systematic
approach to design high-performance bootstrap gate drive
circuits for high-frequency, high-power, and high-efficiency
switching applications using a power MOSFET and IGBT.
It should be of interest to power electronics engineers at all
levels of experience. In the most of switching applications,
efficiency focuses on switching losses that are mainly depen-
dent on switching speed. Therefore, the switching character-
istics are very important in most of the high-power switching
applications presented in this paper. One of the most widely
used methods to supply power to the high-side gate drive cir-
cuitry of the high-voltage gate-drive IC is the bootstrap
power supply. This bootstrap power supply technique has the
advantage of being simple and low cost. However, it has
some limitations, on time of duty-cycle is limited by the
requirement to refresh the charge in the bootstrap capacitor
and serious problems occur when the negative voltage is pre-
sented at the source of the switching device. The most popu-
lar bootstrap circuit solutions are analyzed; including the
effects of parasitic elements, the bootstrap resistor, and
capacitor; on the charge of the floating supply application.
2. High-Speed Gate-Driver Circuitry
2.1 Bootstrap Gate-Drive Technique
The focus of this topic is the bootstrap gate-drive circuit
requirements of the power MOSFET and IGBT in various
switching-mode power-conversion applications. Where
input voltage levels prohibit the use of direct-gate drive cir-
cuits for high-side N-channel power MOSFET or IGBT, the
principle of bootstrap gate-drive technique can be consid-
ered. This method is utilized as a gate drive and accompany-
ing bias circuit, both referenced to the source of the main
switching device. Both the driver and bias circuit swing
between the two input voltage rails together with the source
of the device. However, the driver and its floating bias can
be implemented by low-voltage circuit elements since the
input voltage is never applied across their components. The
driver and the ground referenced control signal are linked by
a level shift circuit that must tolerate the high-voltage differ-
ence and considerable capacitive switching currents between
the floating high-side and ground-referenced low-side cir-
cuits. The high-voltage gate-drive ICs are differentiated by
unique level-shift design. To maintain high efficiency and
manageable power dissipation, the level-shifters should not
draw any current during the on-time of the main switch.
A widely used technique for these applications is called
pulsed latch level translators, shown in Figure 1.
Figure 1. Level-Shifter in High-Side Drive IC
2.2 Bootstrap Drive Circuit Operation
The bootstrap circuit is useful in a high-voltage gate driver
and operates as follows. When the V
S
goes below the IC
supply voltage V
DD
or is pulled down to ground (the low-
side switch is turned on and the high-side switch is turned
off), the bootstrap capacitor, C
BOOT
, charges through the
bootstrap resistor, R
BOOT
, and bootstrap diode, D
BOOT
, from
the V
DD
power supply, as shown in Figure 2. This is pro-
vided by V
BS
when V
S
is pulled to a higher voltage by the
high-side switch, the V
BS
supply floats and the bootstrap
diode reverses bias and blocks the rail voltage (the low-side
switch is turned off and high-side switch is turned on) from
the IC supply voltage, V
DD
.
Figure 2. Bootstrap Power Supply Circuit
UVLO
PULSE GENERATOR
R
R
S
Q
V
B
NOISE
CANCELLER
Shoot-through current
compensated gate driver
HO
V
S
IN
COM
DC SUPPLY
LOAD
V
DD
Q1
Q2
RG2
RG1
D
BOOT
C
BOOT
I
LOAD
R
BOOT
V
DD
LO
HO
V
B
V
S
Bootstrap charge current path
Bootstrap discharge current path
AN-6076 APPLICATION NOTE
© 2008 Fairchild Semiconductor Corporation www.fairchildsemi.com
Rev. 1.4 • 12/18/14 2
2.3 Drawback of Bootstrap Circuitry
The bootstrap circuit has the advantage of being simple and
low cost, but has some limitations.
Duty-cycle and on time is limited by the requirement to
refresh the charge in the bootstrap capacitor, C
BOOT
.
The biggest difficulty with this circuit is that the negative
voltage present at the source of the switching device during
turn-off causes load current to suddenly flow in the low-side
freewheeling diode, as shown in Figure 3.
This negative voltage can be trouble for the gate drivers out-
put stage because it directly affects the source V
S
pin of the
driver or PWM control IC and might pull some of the inter-
nal circuitry significantly below ground, as shown in Figure
4. The other problem caused by the negative voltage tran-
sient is the possibility to develop an over-voltage condition
across the bootstrap capacitor.
The bootstrap capacitor, C
BOOT
, is peak charged by the boot-
strap diode, D
BOOT
, from V
DD
the power source.
Since the V
DD
power source is referenced to ground, the
maximum voltage that can build on the bootstrap capacitor is
the sum of V
DD
and the amplitude of the negative voltage at
the source terminal.
Figure 3. Half-Bridge Application Circuits
Figure 4. V
S
Waveforms During Turn-off
2.4 Cause of Negative Voltage on V
S
Pin
A well-known event that triggers V
S
go below COM
(ground) is the forward biasing of the low-side freewheeling
diode, as shown in Figure 5.
Major issues may appear during commutation, just before
the freewheeling diode starts clamping.
In this case, the inductive parasitic elements, LS1 and LS2,
may push V
S
below COM, more than as described above or
normal steady-state condition.
The amplitude of negative voltage is proportional to the par-
asitic inductances and the turn-off speed, di/dt, of the switch-
ing device; as determined by the gate drive resistor, R
GATE
,
and input capacitance, C
iss
, of switching device.
It is sum of C
gs
and C
gd
, called Miller capacitance.
Figure 5. Step-Down Converter Applications
Figure 6 shows the waveforms of the high-side, N-channel
MOSFET during turn-off.
Figure 6. Waveforms During Turn-off
LOCOM
HO
VS
DC SUPPLY
i
free
VDD
VB
Q1
Q2
RG2
RG1
Ls1
Ls2
High Side OFF
Freewheeling Path
HIN
LIN
HIN
LIN
i
Load
C
BOOT
D
BOOT
R
BOOT
C
IN
-V
S
t
HIN
Freewheeling
t
V
S
-COM
Q1
V
B
IN
GND
HO
V
S
V
DD
INPUT
D1
HVIC
V
CC
V
DC
D
BOOT
C
BOOT
R
GATE
C
DRV
C
OUT
L
S1
L
S2
CC
i
LOAD
i
Free
A B
GND
- V
S
V
OUT
AN-6076 APPLICATION NOTE
© 2008 Fairchild Semiconductor Corporation www.fairchildsemi.com
Rev. 1.4 • 12/18/14 3
2.5 Effects in the Undershoot Spike on V
S
Pin
If undershoot exceeds the absolute maximum rating speci-
fied in the datasheet, the gate drive IC suffers damage or the
high-side output is temporarily unresponsive to input transi-
tion as shown in Figure 7 and Figure 8.
Figure 7 shows Latch-up case that the high-side output does
not changed by input signal. In this case, short-circuit condi-
tion occur on external, main, high-side and low-side
switches in half-bridge topology.
Figure 7. Waveforms in Case of Latch-up
Figure 8 shows Missing case that the high-side output does
not responded to input transition. In this case, the level
shifter of the high-side gate driver suffers form a lack of the
operation voltage headroom. This should be noted, but
proves trivial in most applications, as the high-side in not
usually required to change state immediately following a
switching event.
Figure 8. Waveforms in Case of Signal Missing
2.6 Consideration of Latch-up Problem
The most integrated high-voltage gate-drive ICs have para-
sitic diodes, which, in forward or reverse break-down, may
cause parasitic SCR latch-up. The ultimate outcome of latch-
up often defies prediction and can range from temporary
erratic operation to total device failure. The gate-drive IC
may also be damaged indirectly by a chain of events follow-
ing initial overstress. For example, latch-up could conceiv-
ably result in both output drivers assuming a HIGH state,
causing cross-conduction followed by switch failure and,
finally, catastrophic damage to the gate-drive IC. This failure
mode should be considered a possible root-cause, if power
transistors and/or gate-drive IC are destroyed in the applica-
tion. The following theoretical extremes can be used to help
explain the relationships between excessive V
S
undershoot
and the resulting latch-up mechanism.
In the first case, an "ideal bootstrap circuit" is used in which
V
DD
is driven from a zero-ohm supply with an ideal diode
feed V
B
, as shown in Figure 9. When the high current flow-
ing through freewheeling diode, V
S
voltage is below ground
level by high di/dt. This time, latch-up risk appears since
internal parasitic diode, D
BS
of the gate driver ultimately
enters conduction from V
S
to V
B
, causing the undershoot
voltage to sum with V
DD
, causing the bootstrap capacitor to
overcharge, as shown Figure 10.
For example, if V
DD
=15 V, then V
S
undershoot in excess of
10V forces the floating supply above 25 V, risking break-
down in diode D
BS
and subsequent latch-up.
Figure 9. Case 1: Ideal Bootstrap Circuits
Figure 10. V
B
and V
S
Waveforms of Case 1
INPUT
OUTPUT
Latch-Up Problem
INPUT
OUTPUT
Signal Missing Problem
COM
V
B
V
S
Gate Driver
V
DD
D
BS
V
S
GND
V
B
HIGH V
BS
AN-6076 APPLICATION NOTE
© 2008 Fairchild Semiconductor Corporation www.fairchildsemi.com
Rev. 1.4 • 12/18/14 4
Suppose that the bootstrap supply is replaced with the ideal
floating supply, as shown in Figure 11, such that V
BS
is fixed
under all circumstances. Note that using a low impedance
auxiliary supply in place of a bootstrap circuit can approach
this situation. This time, latch-up risk appears if V
S
under-
shoot exceeds the V
BS
maximum specified in datasheet,
since parasitic diode D
BCOM
ultimately enters conduction
from COM to V
B
, as shown in Figure 12.
Figure 11. Case 2: Ideal Floating Supply
Figure 12. V
B
and V
S
Waveforms of Case 2
A practical circuit is likely to fall somewhere between these
two extremes, resulting in both a small increase of V
BS
and
some V
B
droop below V
DD
, as shown in Figure 13.
Figure 13. Typical Response of V
B
and V
S
Exactly which of the two extremes is prevalent can be
checked as follows. If the V
S
pins undershoot spike has a
time length that is on order of tenths of nanoseconds; the
bootstrap capacitor, C
BOOT
, can become overcharged and the
high-side gate-driver circuit has damage by over-voltage
stress because it exceeds an absolute maximum voltage
(V
BSMAX
) specified in datasheet. Design to a bootstrap cir-
cuit, that does not exceed the absolute maximum rating of
high-side gate driver.
2.7 Effect of Parasitic Inductances
The amplitude of negative voltage is:
To reduce the slope of current flowing in the parasitic induc-
tances to minimize the derivative terms in Equation 1.
For example, if a 10 A, 25 V gate driver with 100nH para-
sitic inductance switches in 50 ns, the negative voltage spike
between V
S
and ground is 20 V.
3. Design Procedure of Bootstrap
Components
3.1 Select the Bootstrap Capacitor
The bootstrap capacitor (C
BOOT
) is charged every time the
low-side driver is on and the output pin is below the supply
voltage (V
DD
) of the gate driver. The bootstrap capacitor is
discharged only when the high-side switch is turned on. This
bootstrap capacitor is the supply voltage (V
BS
) for the high
circuit section. The first parameter to take into account is the
maximum voltage drop that we have to guarantee when the
high-side switch is in on state. The maximum allowable volt-
age drop (V
BOOT
) depends on the minimum gate drive volt-
age (for the high-side switch) to maintain. If V
GSMIN
is the
minimum gate-source voltage, the capacitor drop must be:
where:
V
DD
= Supply voltage of gate driver [V]; and
V
F
= Bootstrap diode forward voltage drop [V]
The value of bootstrap capacitor is calculated by:
where Q
TOTAL
is the total amount of the charge supplied by
the capacitor.
The total charge supplied by the bootstrap capacitor is calcu-
lated by equation 4.:
where:
Q
GATE
= Total gate charge;
I
LKGS
= Switch gate-source leakage current;
I
LKCAP
= Bootstrap capacitor leakage current;
I
QBS
= Bootstrap circuit quiescent current;
I
LK
= Bootstrap circuit leakage current;
Q
LS
= Charge required by the internal level shifter, which is
set to 3 nC for all HV gate drivers;
t
ON
= High-side switch on time; and
COM
V
B
V
S
Gate Driver
V
CC
D
BCOM
V
CC
V
S
GND
V
B
V
B
Below COM
V
S
GND
V
B
V
B
close to COM
Increased V
BS
(1)
dt
di
SSFDBOOTRBOOT
LLVVCOM )()(V
21S
++=
GSMINFDDBOOT
VVVV =Δ
(2)
BOOT
TOTAL
BOOT
V
Q
C
Δ
=
(3)
LSONLKDIODELKQBSLKGSLKCAPGATETOTAL
QtIIIIIQQ ++++++= )(
(4)
AN-6076 APPLICATION NOTE
© 2008 Fairchild Semiconductor Corporation www.fairchildsemi.com
Rev. 1.4 • 12/18/14 5
I
LKDIODED
= Bootstrap diode leakage current.
The capacitor leakage current is important only if an electro-
lytic capacitor is used; otherwise, this can be neglected.
For example: Evaluate the bootstrap capacitor value when
the external bootstrap diode used.
Gate Drive IC = FAN7382 (Fairchild)
Switching Device = FCP20N60 (Fairchild)
Bootstrap Diode = UF4007
V
DD
= 15 V
Q
GATE
= 98 nC (Maximum)
I
LKGS
= 100 nA (Maximum)
I
LKCAP
= 0 (Ceramic Capacitor)
I
QBS
= 120 µA (Maximum)
I
LK
= 50 µA (Maximum)
Q
LS
= 3 nC
T
ON
= 25 µs (Duty=50% at f
s
=20KHz)
I
LKDIODE
= 10 nA
If the maximum allowable voltage drop on the bootstrap
capacitor is 1.0V during the high side switch on state, the
minimum capacitor value is calculated by Equation 3.
The value of bootstrap capacitor is calculated as follows:
The voltage drop due to the external diode is nearly 0.7V.
Assume the capacitor charging time is equal to the high-side
on-time (duty cycle 50%). According to different bootstrap
capacitor values, the following equation applies:
Suggested values are within the range of 100 nF ~ 570 nF,
but the right value must be selected according to the applica-
tion in which the device is used. When the capacitor value is
too large, the bootstrap charging time slows and the low-side
on time might be not long enough to reach the bootstrap volt-
age.
3.2 Select the Bootstrap Resistor
When the external bootstrap resistor is used, the resistance,
R
BOOT
, introduces an additional voltage drop:
where:
I
CHARGE
= Bootstrap capacitor charging current;
R
BOOT
= Bootstrap resistance; and
t
CHARGE
= Bootstrap capacitor charging time (the low-side
turn-on time).
Do not exceed the ohms (typically 5~10 Ω) that increase the
V
BS
time constant. This voltage drop of bootstrap diode
must be taken into account when the maximum allowable
voltage drop (V
BOOT
) is calculated. If this drop is too high or
the circuit topology does not allow a sufficient charging
time, a fast recovery or ultra-fast recovery diode can be used.
4. Consideration of Bootstrap
Application Circuits
4.1 Bootstrap Startup Circuit
The bootstrap circuit is useful in high-voltage gate driver, as
shown in Figure 1. However, it has a initial startup and lim-
ited charging a bootstrap capacitor problem when the source
of the main MOSFET (Q1) and the negative bias node of
bootstrap capacitor (C
BOOT
) are sitting at the output voltage.
Bootstrap diode (D
BOOT
) might be reverse biased at startup
and main MOSFET (Q1) has a insufficient turn-off time for
the bootstrap capacitor to maintain a required charge, as
shown in Figure 1.
In certain applications, like in battery chargers, the output
voltage might be present before input power is applied to the
converter. Delivering the initial charge to the bootstrap
capacitor (C
BOOT
) might not be possible, depending on the
potential difference between the supply voltage (V
DD
) and
output voltage (V
OUT
) levels. Assuming there is enough
voltage differential between input voltage (V
DC
) and output
voltage (V
OUT
), a circuit comprised of startup resistor
(R
START
), startup diode (D
START
), and Zener diode (D
Z
) can
solve the problem, as shown in Figure 14. In this startup cir-
cuit, startup diode D
START
serves as a second bootstrap
diode used for charging the bootstrap capacitor (C
BOOT
) at
power up. Bootstrap capacitor (C
BOOT
) is charged to the
Zener diode of D
Z
, which is supposed to be higher than the
driver's supply voltage (V
DD
) during normal operation. The
charge current of the bootstrap capacitor and the Zener cur-
rent are limited by the startup resistor. For best efficiency,
the value of startup resistor should be selected to limit the
current to a low value, since the bootstrap path through the
startup diode is permanently in the circuit.
][102.105
)103()}1025()1010
10501012010100{()1098(
9
969
6699
C
Q
Total
×=
×+×××+
×+×+×+×=
(6)
][105
1
102.105
9
nF
V
Q
C
BOOT
TOTAL
BOOT
×
=
Δ
=
(7)
(8)
V
BOOT
Δ
Q
TOTAL
C
BOOT
---------------------=
100nF V
BOOT
Δ 1.05 V=
150nF V
BOOT
Δ 0.7 V=
220nF V
BOOT
Δ 0.48 V=
570nF V
BOOT
Δ 0.18 V=
CHARGE
BOOTCHARGE
RBOOT
t
RI
V
=
(5)
AN-6076 APPLICATION NOTE
© 2008 Fairchild Semiconductor Corporation www.fairchildsemi.com
Rev. 1.4 • 12/18/14 6
Figure 14. Simple Bootstrap Startup Circuit
4.2 Resistor in Series with Bootstrap Diode
In the first option, the bootstrap circuit includes a small
resistor, R
BOOT
, in series with bootstrap diode, as shown in
Figure 15. The bootstrap resistor, R
BOOT
, provides current
limit only during a bootstrap charging period which repre-
sents when the V
S
goes below the IC supply voltage, V
CC
, or
is pulled down to ground (the low-side switch is turned on
and the high-side switch is turned off). The bootstrap capaci-
tor, C
BOOT
, charge through the bootstrap resistor, R
BOOT
,
and diode, D
BOOT
, from the V
CC
power supply. The boot-
strap diode must have a break-down voltage (BV) larger than
V
DC
and a fast recovery time to minimize the amount charge
feedback from the bootstrap capacitor to V
CC
power supply.
Figure 15. Adding a Series Resistor with D
BOOT
This method has the advantage of being simple for limiting
the current when the bootstrap capacitor is initially charged,
but it has some limitations. Duty-cycle is limited by the
requirement to refresh the charge in the bootstrap capacitor,
C
BOOT
, and there are startup problems. Do not exceed the
ohms (typically 5~10 Ω) that would increase the V
BS
time
constant. The minimum on-time for charging the bootstrap
capacitor or for refreshing its charge must be verified against
this time constant. The time constant depends on the values
of bootstrap resistance, capacitance, and duty cycle of
switching device calculated in following equation:
where R
BOOT
is the bootstrap resistor; C
BOOT
is the boot-
strap capacitor; and D is the duty cycle.
For example, if R
BOOT
=10, C
BOOT
=1 µF, and D=10 %; the
time constant is calculated in following equation:
Even with a reasonably large bootstrap capacitor and resis-
tor, the time constant may be large. This method can mitigate
the problem. Unfortunately, the series resistor does not pro-
vide a foolproof solution against an over voltage and it
slows down the recharge process of the bootstrap capacitor.
4.3 Resistor Between V
S
and V
OUT
In the second option, the bootstrap circuit includes a small
resistor, R
VS
, between V
S
and V
OUT
, as shown in Figure 16.
Suggested values for R
VS
are in the range of some ohms.
Figure 16. Adding R
VS
in Bootstrap Circuit
The R
VS
works as, not only bootstrap resistor, but also turn-
on and turn-off resistors, as shown in Figure 17. The boot-
strap resistor, turn-on, and turn-off resistors are calculated by
the following equations:
Figure 17. Current Paths of Turn-on and Turn-off
INPUT
R
BOOT
D
BOOT
C
BOOT
C
OUT
D
L
Q1
V
OUT
V
DC
V
DD
D
START
R
START
D
Z
R
GATE
COM
HIN
V
S
V
B
HO
V
DD
D
BOOT
HIN
C
BOOT
V
CC
R
BOOT
Q1
R1
R2
V
B
HIN
COM
HO
V
S
LO
LIN
V
CC
R3
R4
V
DC
Q2
LIN
Load
C1
(9)
τ
R
BOOT
C
BOOT
D
---------------------------------------- s[]=
(10)
τ
R
BOOT
C
BOOT
D
----------------------------------------
10 1
6
0.1
------------------ 100 μs[]===
Q1
V
B
IN
GND
HO
V
S
V
CC
L1
IN
D1
HVIC
V
CC
V
DC
D
BOOT
C
BOOT
R
GATE
C
DRV
C
OUT
R
BOOT
R
VS
V
OUT
R
BOOT
R
BOOT
R
VS
+=
(11)
R
ON
R
GATE
R
VS
+=
(12)
R
OFF
R
GATE
R
VS
+=
(13)
Q1
V
B
IN
GND
HO
V
S
V
CC
L1
IN
D1
V
CC
D
BOOT
C
BOOT
R
GATE
C
DRV
C
OUT
R
BOOT
R
VS
V
OUT
I
BCHG
I
TURN-ON
I
TURN-OFF
AN-6076 APPLICATION NOTE
© 2008 Fairchild Semiconductor Corporation www.fairchildsemi.com
Rev. 1.4 • 12/18/14 7
4.4 Clamping Diode for V
S
and Relocation
Gate Resistor
In the third option, the bootstrap relocates a gate resistor
between V
S
and V
OUT
and adds a low forward-voltage drop
Schottky diode from ground to V
S
, as shown in Figure 18.
The difference between V
B
and V
S
should be kept inside the
absolute maximum specification in the datasheet and must
be satisfied by the following equation:
Figure 18. Clamping Structure
4.5 Relocated Gate Resistor; Double Purpose
The gate resistor sets the turn-on and turn-off speeds in the
MOSFET and provides current limiting for the Schottky
diode during the negative voltage transient of the source ter-
minal of the main switch. In additional, the bootstrap capaci-
tor is protected against over voltage by the two diodes
connected to the ends of C
BOOT
. The only potential hazard
by this circuit is that the charging current of the bootstrap
capacitor must go through gate resistor. The time constant of
C
BOOT
and R
GATE
slows the recharge process, which might
be a limiting factor as the PWM duty cycle.
The fourth options includes relocating a gate resistor
between V
S
and V
OUT
and a clamp device should be posi-
tioned between ground and V
S
, as shown in Figure 19, where
a Zener diode and a 600 V diode are placed. The Zener volt-
age must be sized according to the following rule:
Figure 19. Clamping Structure with Zener Diode
5. Choose Current Capability HVIC
The approximate maximum gate charge Q
G
that can be
switched in the indicated time for each driver current rating
is calculated in Table 1:
Table 1. Example HVIC Current-Drive Capability
Note:
1. For a single 4 A, parallel the two channels of a dual 2 A!
For example, a switching time of 100 ns is:
1 % of the converter switching period at 100 KHz;
3 % of the converter switching period at 300 KHz; etc.
1. Needed gate driver current ratings depend on what gate
charge Q
G
must be moved in switching time t
SW-ON/OFF
(because average gate current during switching is I
G
):
2. The maximum gate charge, Q
G
, is read from the MOSFET
datasheet.
If the actual gate-drive voltage V
GS
is different from the test
condition in the specifications table, use the V
GS
vs. Q
G
curve instead. Multiply the datasheet value by the number
of MOSFETs in parallel.
3. t
SW_ON/OFF
is how fast the MOSFET should be switched.
If unknown, start with 2% of the switching period t
SW
:
If channel (V-I) switching loss is dominated by one switch-
ing transition (turn-on or turn-off), size the driver for that
transition. For clamped inductive switching (the usual case),
channel switching loss for each transition is estimated as:
where V
DS
and I
D
are maximum values during the switching
interval.
4. The approximate current drive capability of gate driver
may be calculated like below
(1) Sourcing Current Capability (Turn-on)
max_ absBSSB
VVV <
(14)
Q1
V
B
IN
GND
HO
V
S
V
CC
L1
IN
D1
HVIC
V
CC
V
DC
D
BOOT
C
BOOT
R
GATE
C
DRV
C
OUT
D
SCHT
V
OUT
(15)
V
B
V
S
–V
BS ABSMAX,
<
Q1
V
B
IN
GND
HO
V
S
V
DD
L1
IN
D1
HVIC
V
CC
V
DC
D
BOOT
C
BOOT
R
GATE
C
DRV
C
OUT
V
OUT
D2
D
Z
Needed
Current
Rating
Switching Time (t
SW_ON/OFF
)
100 ns 50 ns
Maximum Gate Charge (Q
G,MAX
)
2 A 133 nC 67 nC
4 A 267 nC 133 nC
9 A 600 nC 300 nC
offonsw
G
SWAVG
t
Q
I
/_
..
=
(16)
(17)
t
SWON OFF,
0.02 t
SW
×
0.02
f
SW
-----------==
(18)
E
SW
0.5V
DS
I
D
× t
SW
× Joules=
(19)
I
SOURCE
1.5
Q
G
t
SW ON,
-------------------
×
AN-6076 APPLICATION NOTE
© 2008 Fairchild Semiconductor Corporation www.fairchildsemi.com
Rev. 1.4 • 12/18/14 8
(2) Sinking Current Capability (Turn-off)
where:
Q
G
= MOSFET gate charge at V
GS
= V
DD
;
t
SW_ON/OFF
= MOSFET switch turn-on / turn-off time; and
1.5 = empirically determined factor (influenced by delay
through the driver input stages and parasitic elements).
6. Gate Resistor Design Procedure
The switching speed of the output transistor can be con-
trolled by values of turn-on and turn-off gate resistors con-
trolling the turn-on and turn-off current of gate driver. This
section describes basic rules for values of the gate resistors
to obtain the desired switching time and speed by introduc-
ing the equivalent output resistor of the gate driver. Figure
20 shows the equivalent circuit of gate driver and current
flow paths during the turn-on and turn-off, including a gate
driver and switching devices.
Figure 20. Gate Driver Equivalent Circuit
Figure 21 shows the gate-charge transfer characteristics of
switching device during turn-on and turn-off.
Figure 21. Gate Charge Transfer Characteristics
6.1 Sizing the Turn-On Gate Resistor
Turn-on gate resistor, R
g(ON)
, can be chosen to obtain the
desired switching time by using switching time, t
sw
. To
determine a value of resistor using the switching time, sup-
ply voltage, V
DD
(or V
BS
), equivalent on resistance
(R
DRV(ON)
) of the gate driver, and switching device parame-
ters (Q
gs
, Q
gd
, and V
gs(th)
) are needed.
The switching time is defined as the time spent to reach the
end of the plateau voltage (a total Q
gd
+ Q
gd
has been pro-
vided to the MOSFET gate), as shown in Figure 21.
The turn-on gate resistor calculated as follows:
where R
g(ON)
is the gate on resistance and R
DRV(ON)
is the
driver equivalent on resistance.
6.2 Output Voltage Slope
Turn-on gate resistor R
g(ON)
can be determined by control
output slope (dV
OUT
/dt). While the output voltage has a non-
linear behavior, the maximum output slope can be approxi-
mated by:
Inserting the expression yielding I
g(avr)
and rearranging:
where C
gd(off)
is the Miller effect capacitor, specified as C
rss
in the datasheet.
6.3 Sizing the Turn-Off Gate Resistor
The worst case in sizing the turn-off resistor is when the
drain of the MOSFET in turn-off state is forced to commu-
tate by external events.
In this case, dV/dt of the output node induces a parasitic cur-
rent through C
gd
flowing in R
G(OFF)
and R
DRV(OFF)
, as
shown in Figure 22
The following describes how to size the turn-off resistor
when the output dv/dt is caused by the companion MOSFET
turning-on, as shown in Figure 22.
For this reason, the off-resistance must be sized according to
the application worst case. The following equation relates
the MOSFET gate threshold voltage to the drain dv/dt:
(20)
I
SINK
1.5
Q
G
t
SW OFF,
----------------------
×
V
DC
DRIVER
V
DD
GND
DRIVER
R
GATE
C
gd
C
gs
C
gd
C
ds
1
1
2
VB
VS
LO
HO
Turn-On
Turn-Off
ON
OFF
ON
OFF
V
DD
V
BS
C
gs
R
G(ON)
2
HVIC
V
OUT
R
G(OFF)
dV
OUT
dt
dV
OUT
dt
R
DRV(ON)
R
DRV(OFF
)
(21)
I
gavr()
Q
gs
Q
gd
+
t
SW
-------------------------=
(22)
R
TOTAL
R
gON()
R
DRV ON()
+
V
DD
V
gs
+
I
gavr()
---------------------------==
(23)
dV
OUT
dt
------------------
I
gavr()
C
gd off()
-------------------=
(24)
R
TOTAL
V
DD
V
gs th()
C
gd off()
dV
OUT
dt
------------------
------------------------------------------=
AN-6076 APPLICATION NOTE
© 2008 Fairchild Semiconductor Corporation www.fairchildsemi.com
Rev. 1.4 • 12/18/14 9
Figure 22. Current Paths: Low-Side Switch Turned Off,
High-Side Switch Turned On
Rearranging the equation yields:
6.4 Design Example
Determine the turn-on and off gate resistors using the Fairch-
ild MOSFET with FCP20N60 and gate driver with
FAN7382. The power MOSFET of FCP20N60 parameters
are as follows:
Q
gs
=13.5 nC, Q
gd
=36 nC, C
gd
=95 pF, V
GS(th)
=5 V,
V
GS(th)MIN
=3 V
6.4.1 Turn-On Gate Resistance
1) If the desired switching time is 500 ns at V
DD
=15 V, the
average gate charge current is calculated as:
The turn-on resistance value is about 58 Ω.
2) If dV
out
/dt=1 V/ns at V
DD
=15 V, the total gate resistor is
as calculated as:
The turn-on resistance value is about 62 Ω.
7.4.2 Turn-Off Gate Resistance
If dV
out
/dt=1 V/ns, the turn-off gate resistor is calculated as:
8. Power Dissipation Considerations
8.1 Gate Driver Power Dissipation
The total power dissipation is the sum of the gate driver
losses and the bootstrap diode losses. The gate driver losses
are comprised of the static and dynamic losses related to the
switching frequency, output load capacitance on high- and
low-side drivers, and supply voltage, V
DD
.
The static losses are due to the quiescent currents from the
voltage supplies V
DD
and ground in low-side driver and the
leakage current in the level shifting stage in high-side driver,
which are dependent on the voltage supplied on the V
S
pin
and proportional to the duty cycle when only the high-side
power device is turned on.
The dynamic losses are defined as follows: In the low-side
driver, the dynamic losses are due to two different sources.
One is due to whenever a load capacitor is charged or dis-
charged through a gate resistor, half of energy that goes into
the capacitance is dissipated in the resistor. The losses in the
gate drive resistance, internal and external to the gate driver,
and the switching loss of the internal CMOS circuitry. Also,
the dynamic losses of the high-side driver have two different
sources. One is due to the level-shifting circuit and one due
to the charging and discharging of the capacitance of the
high side. The static losses are neglected here because the
total IC power dissipation is mainly dynamic losses of gate
drive IC and can be estimated as:
Figure 23 shows the calculated gate driver power dissipation
versus frequency and load capacitance at V
DD
=15 V. This
plot can be used to approximate the power losses due to the-
gate driver
V
DC
DRIVER
V
DD
GND
DRIVER
R
GATE
C
gd
C
gs
C
gd
C
ds
1
2
VB
VS
LO
HO
Turn-On
Turn-Off
ON
OFF
ON
OFF
V
DD
V
BS
C
gs
R
G( ON)
HVIC
R
G( OFF)
R
DRV(ON)
R
DRV(OFF
)
dV
OUT
dt
i
LOAD
Load
dt
dV
CRR
iRRV
out
gddrvOFFg
gOFFDRVOFFgthgs
×+=
×+
){(
}){(
)()(
)()()(
(25)
)(
)(
g(off)
R
drv
out
gd
thgs
R
d
t
dV
C
V
(26)
][99
500
5.1336
)(
mA
ns
nCnC
t
QQ
I
SW
gdgs
avrg
=
+
=
+
=
(27)
][101
99
515
)(
)(
Ω=
=
=
mAI
VV
R
avrg
thgsDD
Total
(28)
][43
350
15
)(
Ω==
mA
V
I
V
R
SOURCE
DD
ONDRV
(29)
][105
101095
515
912
)(
)(
Ω=
××
=
=
d
t
dV
C
VV
R
OUT
offgd
thGSDD
Total
(30)
][43
350
15
)(
Ω==
mA
V
I
V
R
SOURCE
DD
ONDRV
(31)
][23
650
15
)(
Ω==
mA
V
I
V
R
SINK
DD
OFFDRV
(32)
6.823
101095
3
R
912
)(
min)(
g(off)
=
××
=
drv
out
gd
thgs
R
d
t
dV
C
V
(33)
][2
2
WVfCP
DDsLDGATE
×××=
(34)
AN-6076 APPLICATION NOTE
© 2008 Fairchild Semiconductor Corporation www.fairchildsemi.com
Rev. 1.4 • 12/18/14 10
Figure 23. Gate Driver Total Power Dissipation
The bootstrap circuit power dissipation is the sum of the
bootstrap diode losses and the bootstrap resistor losses if any
exist. The bootstrap diode loss is the sum of the forward bias
power loss that occurs while charging the bootstrap capacitor
and the reverse bias power loss that occurs during reverse
recovery. Since each of these events happens once per cycle,
the diode power loss is proportional to switching frequency.
Larger capacitive loads require more current to recharge the
bootstrap capacitor, resulting in more losses.
Higher input voltages (V
DC
) to the half-bridge result in
higher reverse recovery losses. The total IC power dissipa-
tion can be estimated by summing the gate driver losses with
the bootstrap diode losses, except bootstrap resistor losses.
If the bootstrap diode is within the gate driver, add an exter-
nal diode in parallel with the internal bootstrap diode
because the diode losses can be significant. The external
diode must be placed close to the gate driver to reduce para-
sitic series inductance and significantly lower forward volt-
age drop.
8.2 Package Thermal Resistance
The circuit designer must provide:
Estimate power dissipation of gate driver package
The maximum operating junction temperature T
J,
MAX,OPR
, e.g., 120 °C for these drivers if derated to 80 %
of T
J,MAX
=150 °C.
Maximum operating lead temperature T
L,MAX,OPR
,
approximately equal to the maximum PCB temperature
underneath the driver, e.g., 100 °C.
Maximum allowable junction-to-lead thermal resistance
is calculated by:
9. General Guidelines
9.1 Printed Circuit Board Layout
The layout for minimized parasitic inductances is as follows:
Direct tracks between switches with no loops or deviation.
Avoid interconnect links. These can add significant
inductance.
Reduce the effect of lead-inductance by lowering package
height above the PCB.
Consider co-locating both power switches to reduce track
length.
Placement and routing for decoupling capacitor and gate
resistors as close as possible to gate drive IC.
The bootstrap diode as close as possible to bootstrap
capacitor.
9.2 Bootstrap Components
The bootstrap resistor (R
BOOT
) must be considered in sizing
the bootstrap resistance and the current developed during ini-
tial bootstrap charge. If the resistor is needed in series with
the bootstrap diode, verify that V
B
does not fall below COM
(ground), especially during startup and extremes of fre-
quency and duty cycle.
The bootstrap capacitor (C
BOOT
) uses a low-ESR capacitor,
such as ceramic capacitor. The capacitor from V
DD
to COM
supports both the low-side driver and bootstrap recharge. A
value at least ten times higher than the bootstrap capacitor is
recommended.
The bootstrap diode must use a lower forward voltage drop
and switching time as soon as possible for fast recovery,
such as ultra-fast.
0.1 1 10 100 1000
0.01
0.1
1
Power [W]
Switching frequency [kHz]
C
LOAD
=4400PF
C
LOAD
=470PF
C
LOAD
=1000PF
C
LOAD
=2200PF
At V
DD
= 15V
PKG
LJ
JL
P
TT
max,max,
max,
=
θ
(35)
AN-6076 APPLICATION NOTE
© 2008 Fairchild Semiconductor Corporation www.fairchildsemi.com
Rev. 1.4 • 12/18/14 11
Table 2. Summary of High-Side Gate Drive Circuitry
Method Basic Circuit Advantages & Limitations
High-Side Gate Drivers for P-Channel
Direct Drive
Can be implemented if the maximum input voltage is
less than the gate-to-source break down voltage of
the device.
Open Collector
Simple method, but is not suitable for driving
MOSFET directly in a high-speed application.
Level-Shifted Drive
Suitable for high-speed application and works
seamlessly with regular PWM controller.
High-Side Gate Drivers for N-Channel
Direct Drive
Easiest high-side application the MOSFEF and can
be driven directly by the PWM controller or by a
ground referenced driver, but it must meet two
conditions, as follows:
Floating Supply
Gate Drive
Cost impact of isolated supply is significant. Opto-
coupler tends to be relatively expensive, limited in
bandwidth, and noise sensitive.
Transformer
Coupled Drive
Gives full gate control for an indefinite period of time,
but is somewhat limited in switching performance.
This can be improved with added complexity.
Charge Pump
Drive
The turn-on times tend to be long for switching
applications. Inefficiencies in the voltage
multiplication circuit may require more than low
stages of pumping.
Bootstrap Drive
Simple and inexpensive with limitations; such as,
the duty cycle and on-time are both constrained by
the need to refresh the bootstrap capacitor.
Requires level shift, with the associated difficulties.
Q1
V
CC
L1
D1
PWM
Controller
V
CC
R
GATE
C
OUT
V
OUT
V
OUT
GND
OUT
Q1
GND
V
CC
L1
D1
PWM
Controller
V
CC
V
DC
R
GATE
C
OUT
V
OUT
V
OUT
OUT
R
PULL
Q1
V
CC
L1
D1
PWM
Controller
V
CC
V
DC
R
BASE
C
OUT
V
OUT
V
OUT
R
2
R
GATE
R
1
GND
OUT
Q
INV
Q1
V
CC
L1
D1
PWM
Controller
V
CC
V
DC
R
GATE
C
OUT
V
OUT
V
OUT
GND
OUT
D
SCHT
MillerGSCCDCMAXGSCC
VVVandVV
,,
<<
Q1
V
CC
L1
PWM
Controller
V
CC
V
DC
R
GATE
C
OUT
V
OUT
V
OUT
Q2
R
GATE
GND
Floating
Supply
HO
Opto
LO
Q1
V
CC
L1
PWM
Controller
V
CC
V
DC
R
GATE
C
OUT
V
OUT
V
OUT
Q2
T1
R
GATE
C
BLOCK
GND
OUT2
OUT1
Q1
GND
V
CC
L1
D1
PWM
Controller
V
CC
V
DC
C
OUT
V
OUT
V
OUT
OUT
Q1
V
B
IN
GND
HO
V
S
V
CC
L1
IN
D1
HVIC
V
CC
V
DC
D
BOOT
C
BOOT
R
GATE
C
DRV
C
OUT
V
OUT
AN-6076 APPLICATION NOTE
© 2008 Fairchild Semiconductor Corporation www.fairchildsemi.com
Rev. 1.4 • 12/18/14 12
Consideration Points of Bootstrap Circuit Problem
Remedies of Bootstrap Circuit Problem
Q1
V
B
IN
GND
HO
V
S
V
CC
INPUT
D1
HVIC
V
CC
V
DC
D
BOOT
C
BOOT
R
GATE
C
DRV
C
OUT
The amplitude of the negative voltage is proportional
parasitic inductances and the turn-off speed (di/dt) of
the switching device, Q1, which is determined by gate
resistor, R
GATE
, and input capacitance, C
iss
.
L
S1
L
S2
Latch-up,
propagation signal
missing and over-
voltage across the
bootstrap
capactor
If V
S
goes significantly below
ground, the gate driver can
have serious troubles.
Negative voltage transient
at high-side switch turn-off.
CC
V
DC
+V
GS,Miller
V
DC
V
BS
Recovery Time
A-Point
B-Point
C-Point
V
GS
=B-C Point
i
LOAD
i
Free
A B
GND
- V
S
V
BS
= (V
CC
-V
FBD
) - (-V
S
)
AN-6076 APPLICATION NOTE
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS
HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE
APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS
PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS
WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used
herein:
1. Life support devices or systems are devices or systems which,
(a) are intended for surgical implant into the body, or
(b) support or sustain life, or
(c) whose failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be reason
ably expected to result in significant injury to the user.
2. A critical component is any component of a life support
device or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
© 2008 Fairchild Semiconductor Corporation www.fairchildsemi.com
Rev. 1.4 • 12/18/14 13
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